Designed to explore valuable innovations emerging at the confluence of high performance computing and existing scientific instruments used in characterization and testing in major industries such as semiconductors, healthcare, materials, biotechnology, etc.
Scientific instruments have been, up until now, limited in its capabilities and operating features by limitations imposed by underlying operating principle, existing data acquisition, data processing and data visualization technologies.
We have reached a stage in the development of several established and emerging industries in which is foreseeable scientific metrology, online characterization, device and process simulation will all play critical roles developing the next generation of critical technologies to various critical components of those industries. There are several industries in which this trend is already apparent: microelectronics, drug discovery, new materials, clinical diagnostics, homeland security and environment protection.
We are particularly interested in surface metrology applied to semiconductor processing for inline metrology for QA purposes since it is an industry in which Chile has no participation at the same time it faculty in the various physics, materials, chemistry and engineering departments that may become keen on developing new competences.
This program requires developing scientific and engineering competences in measurement and characterization technologies. Also requires developing market understanding of the various segments of the research instruments and characterization instruments industry. Specific requirements for hardware, software. Access to small high performance computers ranging from high end workstations, to low end computing clusters.